[PDF] Zener zap anti-fuse trim in VLSI circuits -
DT Comer - VLSI Design, 1996 - hindawi.com
... either bipolar or MOS integrated circuit processes and its use requires a spe- cial
processing step in the fabrication cycle. The Ze- ner zap method requires a ...

[PDF] NEW MINERAL NAMES
ZVM O-vo - minsocam.org
... Zap. ... a new barium iron aluminum phosphate from the Yukon Territory, Canada ... material
is preserved in the Mineralogical Museum, Academy of Sciences, USSR, Mos- cow ...
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Trim zener using double poly process
A Strachan, W Yindeepol - US Patent 6,979,879, 2005 - patentstorm.us
... 5019878 Programmable interconnect or cell using silicided MOS transistors Issued
on ... Inventor: Tsuyuki 6563189 Method of adding Zener zap aluminum bridged anti ...

C-MOS/SOS LSI input/Output protection networks -
BT Ahlport, JR Cricchi, DA Barth - Electron Devices, IEEE Transactions on, 1978 - ieeexplore.ieee.org
... High-voltage exponential zap tests also were done ... The sizing of the single-level
aluminum conductors is chosen ... the course of developing complex C-MOS/SOS logic ...

[CITATION] POLAROGRAPHIC DETERMINATION OF EXCHANGEABLE ALUMINUM IN SOILS
IL ABARBARCHUK, KP DOSTITSYNA, YEM SKOBETS? - Soviet Soil Science

Fuse element for effective laser blow in an integrated circuit device -
PIP Lee, F Prein - US Patent 5,608,257, 1997 - freepatentsonline.com
... Fuse elements are routinely built of aluminum, copper, polysilicon, silicide or
any high ... conductive lines, so as to require less energy to zap the connection. ...

Basic MOS feature dimensions may fall to the 0.5-. m level by the mid-1980's. Such scaling will … -
J Hayes - CELL - ieeexplore.ieee.org
Page 1. Basic MOS feature dimensions may fall to the 0.5-.m level by the mid-1980's. ...
In the past decade, the MOS industry has grown explosively. ...
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Protective circuit for insulated gate field effect transistor integrated circuits -
A London - US Patent 4,264,941, 1981 - freepatentsonline.com
... of p and n channel type MOS field effect ... output is the one to which zap testing refers ...
Circuit metallization, eg aluminum, connects the input ohmically (in a non ...

Effect of crystallization on the adhesion of polycaprolactam to metal
NI Egorenkov, AN Isterin, VL Potekha - Mechanics of Composite Materials, 1976 - Springer
... Analysis of the Textile Yarn Friction Process [in Russian], Mos- cow (1957). ... Zap. ...
ecuiar struc- ture of polycaprolactam and its adhesion to aluminum has been ...
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[CITATION] VMOS Reliability
VN RESISTOR - IEEE Transactions on Electron Devices, 1963 - Institute of Electrical and Electronics Engineers
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